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Platforma edukacyjno-badawcza NI Elvis II
Research EquipmentPoznanie budowy, zasad działania podstawowych układów elektronicznych, cyfrowych układów logiki programowalnej, mikrokontrolerów jednoukładowych oraz procesorów sygnałowych.
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Low temperature cracking equipment: Termal Stress Restrained Specimen Test (TSRST); Uniaxial Tensile Strength Test (UTST); Tensile Creep Test (TCT); Relaxation Test (RT);
Research Equipment