Search results for: INTEGRATED ΜBIST - Bridge of Knowledge

Search results for: INTEGRATED ΜBIST

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Two‐functional μBIST for Testing and Self‐Diagnosis of Analog Circuits in Electronic Embedded Systems
Publication
- D. Załęski
- R. Zielonko
- Acta Imeko - Year 2014
The paper concerns the testing of analog circuits and blocks in mixed‐signal Electronic Embedded Systems (EESs), using the Built‐in Self‐Test (BIST) technique. An integrated, two‐functional, embedded microtester (μBIST) based on reuse of signal blocks already present in an EES, such as microprocessors, memories, ADCs, DACs, is presented. The novelty of the μBIST solution is its extended functionality. It can perform 2 testing functions:...

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A solution of the integrated µBIST for functional and diagnostic testing in mixed-signal electronic embedded systems
Publication
- D. Załęski
- R. Zielonko
- Year 2013
Main problem of the paper is testing of analog circuits and blocks in mixed-signal electronic embedded systems (EESs), using the built-in self-test (BIST) technique. The integrated mBIST based on reusing signal blocks already present in an EES, such as processors, memories, ADCs, is presented. The novelty of the solution is the extended functionality of the mBIST. It can perform 2 testing functions: functional testing and fault...