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(Field of Science)
Ministry points: Help
| Year | Points | List |
|---|---|---|
| Year 2024 | 40 | Ministry scored journals list 2024 |
| Year | Points | List |
|---|---|---|
| 2024 | 40 | Ministry scored journals list 2024 |
| 2023 | 40 | Ministry Scored Journals List |
| 2022 | 40 | Ministry Scored Journals List 2019-2022 |
| 2021 | 40 | Ministry Scored Journals List 2019-2022 |
| 2020 | 40 | Ministry Scored Journals List 2019-2022 |
| 2019 | 40 | Ministry Scored Journals List 2019-2022 |
| 2018 | 20 | A |
| 2017 | 20 | A |
| 2016 | 15 | A |
| 2015 | 15 | A |
| 2014 | 20 | A |
| 2013 | 15 | A |
| 2012 | 20 | A |
| 2011 | 20 | A |
| 2010 | 20 | A |
Model:
Points CiteScore:
| Year | Points |
|---|---|
| Year 2023 | 3.3 |
| Year | Points |
|---|---|
| 2023 | 3.3 |
| 2022 | 3.2 |
| 2021 | 3 |
| 2020 | 3 |
| 2019 | 2.7 |
| 2018 | 2.4 |
| 2017 | 2.1 |
| 2016 | 2.4 |
| 2015 | 2.2 |
| 2014 | 2.2 |
| 2013 | 2.3 |
| 2012 | 2.1 |
| 2011 | 2 |
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Papers published in journal
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total: 3
Catalog Journals
Year 2020
-
Bisquare robust polynomial fitting method for dimple distortion minimization in surface quality analysis
Publication
Year 2015
-
Application of multisine nanoscale impedance microscopy to heterogeneous alloy surface investigations
PublicationIn the recent years atomic force microscopy is recognized as valuable tool for investigation of surficial features of construction materials. It concerns, among other things, studies of changes caused by such phenomena as galvanic corrosion, passivation associated with the growth of oxide layers, or sensitization of austenitic steels with the formation of carbide phases. In addition, atomic forcemicroscopy allows easy coupling...
Year 2008
-
Reactive deposition of TiNx layers in a DC-magnetron discharge
PublicationTiNx layers have been deposited in 'balanced mode' and 'unbalanced mode' of a reactive DC-magnetron plasma (carrier gas argon, reactive gas nitrogen) under different conditions. Discharge power and reactive gas flow have been varied. The layers have been examined by X-ray photoelectron spectroscopy (XPS), X-ray reflectometry (XR), and spectroscopic ellipsometry (SE). The results of the layer analyses were combined with plasma investigations...
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