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A method of self-testing of analog circuits based on fully differential op-amps with theTCBF classifier
Abstract
A new approach of self-testing of analog circuits based on fully differential op-amps of mixed-signal systems controlled by microcontrollers is presented. It consists of a measurement procedure and a fault diagnosis procedure. We measure voltage samples of a time response of a tested circuit on a stimulation of a unit step function given at the common-mode reference voltage input of the op-amp. The fault detection and fault localization is carried out by the TCBF neural network classifier.
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- Category:
- Conference activity
- Type:
- publikacja w wydawnictwie zbiorowym recenzowanym (także w materiałach konferencyjnych)
- Title of issue:
- XXI IMEKO WORLD CONGRESS – FULL PAPERS strony 538 - 543
- Language:
- English
- Publication year:
- 2015
- Bibliographic description:
- Czaja Z., Kowalewski M.: A method of self-testing of analog circuits based on fully differential op-amps with theTCBF classifier// XXI IMEKO WORLD CONGRESS – FULL PAPERS/ ed. Assoc. Prof. Jan Holub Praga: Czech Technical University in Prague Faculty of Electrical Engineering, Department of Measurement, 2015, s.538-543
- Verified by:
- Gdańsk University of Technology
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