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Abstract
In the paper, a new method, called the noise scatterin pattern method (NSP method), for random telegraph signal noise identyfication in the inherent noise of semiconductor devices is described. A block diagram of a noise measurement system based on the NSP method is presented. Examples of patterns of the NSP method are presented.
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- Category:
- Articles
- Type:
- artykuł w czasopiśmie z listy filadelfijskiej
- Published in:
-
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
no. 57,
pages 1199 - 1206,
ISSN: 0018-9456 - Language:
- English
- Publication year:
- 2008
- Bibliographic description:
- Konczakowska A., Cichosz J., Szewczyk A.: A new nethod for RTS noise of semiconductor devices identification// IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. -Vol. 57., nr. no 6 (2008), s.1199-1206
- Verified by:
- Gdańsk University of Technology
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