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Abstract
In recent years, there is noticeable interest in application of various types of scanning probe microscopy in material science research. One of them is contact atomic force microscopy combined with local impedance measurements, known as nanoscale impedance microscopy. Literature references present its application in investigations of new materials, microelectronics diagnostics, or research of protective coatings performance. In this paper, the authors present assumptions of methodology, important modes of operation, practical aspects of measurement system, and also exemplary results of application in fields of materials’ characterization.
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Details
- Category:
- Articles
- Type:
- publikacja w in. zagranicznym czasopiśmie naukowym (tylko język obcy)
- Published in:
-
Surface Innovations
no. 3,
edition 3,
pages 181 - 189,
ISSN: 2050-6252 - Title of issue:
- Surface Innovations strony 181 - 189
- Language:
- English
- Publication year:
- 2015
- Bibliographic description:
- Zieliński A.. Application of different modes of nanoscale impedance microscopy in materials research. Surface Innovations, 2015, Vol. 3, iss. 3, s.181-189
- DOI:
- Digital Object Identifier (open in new tab) 10.1680/jsuin.15.00006
- Verified by:
- Gdańsk University of Technology
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