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Determination of the refractive index and wavelength‐dependent optical properties of few‐layer CrCl3 within the Fresnel formalism
Abstract
Based on previous reports on the optical microscopy contrast of mechanically exfoliated few layer CrCl3 transferred on 285 nmand 270 nmSiO2 on Si(100), we focus on the experimental determination of an effective mean complex refractive index via a fitting analysis based on the Fresnel equations formalism. Accordingly, the layer and wavelength-dependent absorbance and reflectance are calculated. Layer and wavelength-dependent optical contrast curves are then evaluated demonstrating that the contrast is significantly high only around welldefined wavelength bands. This is validated a posteriori, by experimental UVVis absorbance data. The present study aims to show the way towards the most reliable determination of thickness of the 2D material flakes during exfoliation.
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Authors (6)
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Shafaq Kazim
-
Roberto Gunnella
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Marco Zannotti
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Rita Giovannetti
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Luca Ottaviano
Cite as
Full text
- Publication version
- Accepted or Published Version
- DOI:
- Digital Object Identifier (open in new tab) 10.1111/jmi.13015
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Details
- Category:
- Articles
- Type:
- artykuły w czasopismach
- Published in:
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JOURNAL OF MICROSCOPY
no. 283,
pages 145 - 150,
ISSN: 0022-2720 - Language:
- English
- Publication year:
- 2021
- Bibliographic description:
- Kazim S., Gunnella R., Zannotti M., Giovannetti R., Klimczuk T., Ottaviano L.: Determination of the refractive index and wavelength‐dependent optical properties of few‐layer CrCl3 within the Fresnel formalism// JOURNAL OF MICROSCOPY -Vol. 283,iss. 2 (2021), s.145-150
- DOI:
- Digital Object Identifier (open in new tab) 10.1111/jmi.13015
- Sources of funding:
-
- Free publication
- Verified by:
- Gdańsk University of Technology
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