Depth XPS profile of Fe-S layers on a titanium substrate

Description

Depth XPS profile of Fe-S layers on a titanium substrate was measured. Material was etched by Argon ion gun and measured by XPS method. For each sample, three times per 10 minutes each was sputtered.

Dataset file

XPS.zip

2.3 MB, S3 ETag 8ab0d9955cca421772007fa562ac0567-1, downloads: 33

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CC BY

Attribution
Raw data:: Data contained in dataset was not processed.
Software:: origin

Details

Year of publication:

2021

Verification date:

2021-06-24

Creation date:

2017

Dataset language:

English

Fields of science:

materials engineering (Engineering and Technology)

DOI:

10.34808/pd69-gw55

Verified by:

Gdańsk University of Technology

Keywords

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Authors

Marcin Stanisław Łapiński dr hab. inż.
Institute of Nanotechnology and Materials Engineering
orcid number 0000-0002-3283-2886open in new tab
Creator

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