Depth XPS profile of Fe-S layers on a titanium substrate - Open Research Data - Bridge of Knowledge

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Depth XPS profile of Fe-S layers on a titanium substrate

Description

Depth XPS profile of Fe-S layers on a titanium substrate was measured. Material was etched by Argon ion gun and measured by XPS method. For each sample, three times per 10 minutes each was sputtered.

Dataset file

XPS.zip
2.3 MB, S3 ETag 8ab0d9955cca421772007fa562ac0567-1, downloads: 7
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hexmd5(md5(part1)+md5(part2)+...)-{parts_count} where a single part of the file is 512 MB in size.

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download file XPS.zip

File details

License:
Creative Commons: by 4.0 open in new tab
CC BY
Attribution
Raw data:
Data contained in dataset was not processed.
Software:
origin

Details

Year of publication:
2021
Verification date:
2021-06-24
Creation date:
2017
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/pd69-gw55 open in new tab
Verified by:
Gdańsk University of Technology

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