Depth XPS profile of vanadium pentoxide - Open Research Data - Bridge of Knowledge

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Depth XPS profile of vanadium pentoxide

Description

Vanadium pentoxide sample was manufactured by sol-gel method and deposited on a substrate by spin coating technique. To determine depth profile of chemical composition of thin film, etching by Argon ion gun was used. Thin film was etched three times. Chemical composition was measured by XPS method.

Dataset file

XPS.zip
383.5 kB, S3 ETag ff21bb568f65631694a1c432cbd7b6ca-1, downloads: 5
The file hash is calculated from the formula
hexmd5(md5(part1)+md5(part2)+...)-{parts_count} where a single part of the file is 512 MB in size.

Example script for calculation:
https://github.com/antespi/s3md5
download file XPS.zip

File details

License:
Creative Commons: by 4.0 open in new tab
CC BY
Attribution
Raw data:
Data contained in dataset was not processed.
Software:
origin

Details

Year of publication:
2021
Verification date:
2021-06-24
Creation date:
2017
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/bvsh-gg85 open in new tab
Verified by:
Gdańsk University of Technology

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