High temperature XRD diffraction patterns collected during the reoxidation process of SFM-based compounds - Open Research Data - Bridge of Knowledge

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High temperature XRD diffraction patterns collected during the reoxidation process of SFM-based compounds

Description

This dataset contains three file folders for SFM, LSFM (La-doped) and SFMNb (Nb-doped) respectively. Samples were reduced prior to the XRD measurements. The measurements were performed on Philipps X’Pert Pro diffractometer using a high-temperature Anthon Paar HT-1200 oven adapter. Scans were performed each 50 deg. in air. The data in dataset were already exported to the *.asc from *.xrdml.

Dataset file

062023_HT_XRD_SFM, LSFM, SFMNb.zip
2.3 MB, S3 ETag 8a60c1a292d3ad7d2e7253458ed16fee-1, downloads: 1
The file hash is calculated from the formula
hexmd5(md5(part1)+md5(part2)+...)-{parts_count} where a single part of the file is 512 MB in size.

Example script for calculation:
https://github.com/antespi/s3md5

File details

License:
Creative Commons: by 4.0 open in new tab
CC BY
Attribution
File embargo:
2025-06-15

Details

Year of publication:
2024
Verification date:
2024-01-15
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/4h3p-7786 open in new tab
Funding:
Series:
Verified by:
Gdańsk University of Technology

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