Luminescence of TeO2:Eu thin films

Description

Tellurium dioxide doped by europium thin films were deposited by magnetron sputtering method and simultaneously heated at 200 ^oC. Presence of Eu ions and their valence states was confirmed by X-ray photoemission spectroscopy measurements. The structure of the films as well as the influence of europium dopant on crystalline structure of the films was examined by X-ray diffraction method. Morphology of the samples was observed by atomic force microscope. Doping by europium didn’t change structural parameters. Optical measurements showed photoluminescence from both Eu²⁺ and Eu³⁺ ions.

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TeO2.zip

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Details

Year of publication:

2021

Verification date:

2021-06-24

Creation date:

2016

Dataset language:

English

Fields of science:

materials engineering (Engineering and Technology)

DOI:

10.34808/vecs-6k47

Verified by:

Gdańsk University of Technology

Keywords

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Authors

Marcin Stanisław Łapiński dr inż.
Instytut Nanotechnologii i Inżynierii Materiałowej
orcid number 0000-0002-3283-2886open in new tab
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