Description
Tellurium dioxide doped by europium thin films were deposited by magnetron sputtering method and simultaneously heated at 200 oC. Presence of Eu ions and their valence states was confirmed by X-ray photoemission spectroscopy measurements. The structure of the films as well as the influence of europium dopant on crystalline structure of the films was examined by X-ray diffraction method. Morphology of the samples was observed by atomic force microscope. Doping by europium didn’t change structural parameters. Optical measurements showed photoluminescence from both Eu2+ and Eu3+ ions.
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TeO2.zip
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File details
- License:
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open in new tabCC BYAttribution
- Raw data:
- Data contained in dataset was not processed.
Details
- Year of publication:
- 2021
- Verification date:
- 2021-06-24
- Creation date:
- 2016
- Dataset language:
- English
- Fields of science:
-
- materials engineering (Engineering and Technology)
- DOI:
- DOI ID 10.34808/vecs-6k47 open in new tab
- Verified by:
- Gdańsk University of Technology
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