Structure and optical measurements of Eu doped tellurium oxide thin films - Open Research Data - Bridge of Knowledge

Your account

login

Search

Structure and optical measurements of Eu doped tellurium oxide thin films

Description

Thin films were deposited by magnetron sputtering method and simultaneously heated at 200 oC. Presence of Eu ions and their valence states was confirmed by X-ray photoemission spectroscopy measurements. The structure of the films as well as the influence of europium dopant on crystalline structure of the films was examined by X-ray diffraction method.  Morphology of the samples was observed by atomic force microscope. Doping by europium didn’t change structural parameters. Optical measurements showed photoluminescence from Eu2+ and Eu3+ ions. However, in the spectrum there is no line corresponding to 5D0 -> 7F2 transition due to an electric-dipole transition, usually present in amorphous surrounding.

Dataset file

TeOx.zip
1.5 MB, S3 ETag b60cc62aaf89152adf900416f1134bb6-1, downloads: 53
The file hash is calculated from the formula
hexmd5(md5(part1)+md5(part2)+...)-{parts_count} where a single part of the file is 512 MB in size.

Example script for calculation:
https://github.com/antespi/s3md5
download file TeOx.zip

File details

License:
Creative Commons: by-nc 4.0 open in new tab
CC BY-NC
Non-commercial
Software:
origin

Details

Year of publication:
2019
Verification date:
2021-05-14
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
DOI:
DOI ID https://doi.org/10.1016/j.tsf.2019.137592 open in new tab
Verified by:
Gdańsk University of Technology

Keywords

Cite as

Authors

seen 112 times