Description
Raw Raman spectra and XRD diffractograms (background subtracted) of 13 among which carbon-derived secondary waste and reference materials.
Raman spectra were collected measured using a commercial Raman microscope (LabRam Aramis, Horiba) with excitation by a 632.8 nm HeNe laser with up to 20 mW, integration time of 5 s (20 averages); 300 lines per mm diffraction grating.
XRD diffractograms were using BRUKER D2PHASER equipment with Cu Kα radiation (lambda = 1.54 Å), operating at 30 kV and 10 mA. The XRD patterns were collected using a scan step of 0.02° and a count time of 0.4 s per step.
Sample ID is reported in the attached file.
Dataset file
CSWM.zip
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File details
- License:
-
open in new tabCC BYAttribution
- Raw data:
- Data contained in dataset was not processed.
Details
- Year of publication:
- 2024
- Verification date:
- 2024-02-23
- Dataset language:
- English
- Fields of science:
-
- automation, electronics, electrical engineering and space technologies (Engineering and Technology)
- materials engineering (Engineering and Technology)
- DOI:
- DOI ID 10.34808/ynj6-6r28 open in new tab
- Funding:
- Verified by:
- Gdańsk University of Technology
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