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SWM for porous hierarchical nanocarbons composites

Description

Raw Raman spectra and XRD diffractograms (background subtracted) of 13 among which carbon-derived secondary waste and reference materials. 

Raman spectra were collected measured using a commercial Raman microscope (LabRam Aramis, Horiba) with excitation by a 632.8 nm HeNe laser with up to 20 mW, integration time of 5 s (20 averages); 300 lines per mm diffraction grating.

XRD diffractograms were using BRUKER D2PHASER equipment with Cu Kα radiation (lambda = 1.54 Å), operating at 30 kV and 10 mA. The XRD patterns were collected using a scan step of 0.02° and a count time of 0.4 s per step.

Sample ID is reported in the attached file.

Dataset file

CSWM.zip
653.0 kB, S3 ETag a4c045c35187dcd3b2f0db0fe5c516b3-1, downloads: 1
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File details

License:
Creative Commons: by 4.0 open in new tab
CC BY
Attribution
Raw data:
Data contained in dataset was not processed.

Details

Year of publication:
2024
Verification date:
2024-02-23
Dataset language:
English
Fields of science:
  • automation, electronics, electrical engineering and space technologies (Engineering and Technology)
  • materials engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/ynj6-6r28 open in new tab
Funding:
Verified by:
Gdańsk University of Technology

Keywords

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