X-Ray diffraction of the metallic nanostructures - Open Research Data - Bridge of Knowledge

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X-Ray diffraction of the metallic nanostructures

Description

Metallic nanostructures (gold and silver) were manufactured as a thermal annealing of gold or silver thin film. Gold films with thickness of 2.8 nm were deposited on a silicon substrates using a table-top dc magnetron sputtering coater (EM SCD 500, Leica), equipped with quartz microbalance for in-situ thickness measurements. Films were deposited from high purity (99.99%) gold or silver targets in pure Argon plasma. Thermal treatment of metallic thin film  resulted in forming spherical isolated islands. XRD investigations (X'Pert diffractometer, using CuKα radiation in a range of 10°–70° of 2θ) showed an epitaxial growth of the structures. The crystallographic structure of metallic nanostructures repeat structure of silicon substrate.

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XRD.zip
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Creative Commons: by 4.0 open in new tab
CC BY
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Data contained in dataset was not processed.
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Details

Year of publication:
2021
Verification date:
2021-06-24
Creation date:
2017
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/ctbw-ab05 open in new tab
Verified by:
Gdańsk University of Technology

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