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Description
Graphene oxides samples were measured by XPS method. The X-ray photoemission spectroscopy measurements were carried out with Omicron NanoTechnology UHV equipment. The hemispherical spectrophotometer was equipped with a 128-channel collector. The XPS measurements were performed at room temperature at a pressure below 1.1 × 10−8 mBar. The photoelectrons were excited by an Mg-Kα X-Ray source. The X-ray anode was operated at 15 keV and 300 W. Obtained results were analyzed by Xasa XPS software.
For measurements powders of the pure graphene oxide (GO), reduced graphene oxide (rGO) and functionalized by S and N elements graphene oxide were selected. Nitrogen doped graphene oxide was synthesized by the hydrothermal method.
Dataset file
XPS_powders.opj
2.1 MB,
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File details
- License:
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CC BYAttribution - Raw data:
- Data contained in dataset was not processed.
- Software:
- origin
Details
- Year of publication:
- 2021
- Verification date:
- 2021-07-20
- Creation date:
- 2019
- Dataset language:
- English
- Fields of science:
-
- materials engineering (Engineering and Technology)
- DOI:
- DOI ID 10.34808/wyh2-d333 open in new tab
- Verified by:
- Gdańsk University of Technology
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