XPS measurement of the Fe-Ti based materials - Open Research Data - Bridge of Knowledge

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XPS measurement of the Fe-Ti based materials

Description

The mono‐ and bimetal‐modified (Pd, Cu) titanium(IV) oxide and iron oxide (III) photocatalysts were prepared by chemical reduction method and characterized using XPS method. The composition of elements incorporated in the surface layer of mono- and bimetallic photocatalysts was determined by XPS analysis, as well as the valence state of elements. Measurements confirmed composition and presence of Pd and Cu dopants. Additionally it confirmed a mixed valence state of Fe in a iron oxides structures.

Dataset file

xps.zip
1.1 MB, S3 ETag bcea931759e10fb8bed677fa5c541ac0-1, downloads: 13
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File details

License:
Creative Commons: by 4.0 open in new tab
CC BY
Attribution
Raw data:
Data contained in dataset was not processed.
Software:
origin

Details

Year of publication:
2021
Verification date:
2021-06-25
Creation date:
2016
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/29mc-kd34 open in new tab
Verified by:
Gdańsk University of Technology

Keywords

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