XPS measurement of the Fe-Ti based materials

Description

The mono‐ and bimetal‐modified (Pd, Cu) titanium(IV) oxide and iron oxide (III) photocatalysts were prepared by chemical reduction method and characterized using XPS method. The composition of elements incorporated in the surface layer of mono- and bimetallic photocatalysts was determined by XPS analysis, as well as the valence state of elements. Measurements confirmed composition and presence of Pd and Cu dopants. Additionally it confirmed a mixed valence state of Fe in a iron oxides structures.

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xps.zip

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CC BY

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Details

Year of publication:

2021

Verification date:

2021-06-25

Creation date:

2016

Dataset language:

English

Fields of science:

materials engineering (Engineering and Technology)

DOI:

10.34808/29mc-kd34

Verified by:

Gdańsk University of Technology

Keywords

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Authors

Marcin Stanisław Łapiński dr hab. inż.
Institute of Nanotechnology and Materials Engineering
orcid number 0000-0002-3283-2886open in new tab
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