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Description
Yttrium-doped strontium titanate was prepared via conventional solid-state reaction method from Y2O3 (Sigma Aldrich, 99,9%), TiO2 (Sigma Aldrich, 99%) and SrCO3 (Sigma Aldrich,98%). For comparision, two other techniques were used for synthesis: Pechini and wet methods. Both kind of samples were measured, after and before reduction process (in a hydrogen). Chemical composition of manufactured samples was measured by XPS method. XPS analyses were carried out with X-ray photoelectron spectrometer (Omicron NanoTechnology) with 128-channel collector. XPS measurements were performed at room temperature in a ultra-high vacuum conditions, below 1.1 x10-8 mBar. The photoelectrons were excited by an Mg-Ka X-Ray source. The X-ray anode was operated at 15 keV and 300 W. Omicron Argus hemispherical electron analyser with round aperture of 4 mm was used for analysing of emitted photoelectrons. The binding energies were corrected using the background C1s line (285.0 eV). XPS spectra were analysed with Casa-XPS software using a Shirley background subtraction and Gaussian–Lorentzian curve as a fitting algorithm.
Dataset file
hexmd5(md5(part1)+md5(part2)+...)-{parts_count} where a single part of the file is 512 MB in size.Example script for calculation:
https://github.com/antespi/s3md5
File details
- License:
-
open in new tab
CC BYAttribution - Raw data:
- Data contained in dataset was not processed.
- Software:
- origin
Details
- Year of publication:
- 2021
- Verification date:
- 2021-06-25
- Creation date:
- 2017
- Dataset language:
- English
- Fields of science:
-
- materials engineering (Engineering and Technology)
- DOI:
- DOI ID 10.34808/hkjr-eg12 open in new tab
- Verified by:
- Gdańsk University of Technology
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