DFT modelling of the edge dislocation in 4H-SiC - Publication - Bridge of Knowledge

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DFT modelling of the edge dislocation in 4H-SiC

Abstract

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Authors (8)

  • Photo of J. Łażewski

    J. Łażewski

  • Photo of P. Jochym

    P. Jochym

  • Photo of P. Piekarz

    P. Piekarz

  • Photo of M. Sternik

    M. Sternik

  • Photo of K. Parlinski

    K. Parlinski

  • Photo of J. Cholewiński

    J. Cholewiński

  • Photo of P. Dłużewski

    P. Dłużewski

  • Photo of S. Krukowski

    S. Krukowski

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Details

Category:
Magazine publication
Type:
Magazine publication
Published in:
JOURNAL OF MATERIALS SCIENCE no. 54, edition 15, pages 10737 - 10745,
ISSN: 0022-2461
ISSN:
0022-2461
Publication year:
2019
DOI:
Digital Object Identifier (open in new tab) 10.1007/s10853-019-03630-5
Verified by:
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