Enhancement of defects induced optical nonlinearity in Al: ZnO thin films by electron beam - Publication - Bridge of Knowledge

Enhancement of defects induced optical nonlinearity in Al: ZnO thin films by electron beam

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Authors (9)

Albin Antony
Poornesh P
J. Jedryka
K. Ozga
Gopalkrishna Hegde
Suresh Kulkarni
Vikash Chandra
Vijay Verma
Jishnu Dwivedi

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Details

Category:: Magazine publication
Type:: Magazine publication
Published in:: MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING no. 128,
ISSN: 1369-8001
ISSN:: 13698001
Publication year:: 2021
DOI:: Digital Object Identifier (open in new tab) 10.1016/j.mssp.2021.105747
Verified by:: No verification

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