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The fast beam condition monitor BCM1F backend electronics upgraded MicroTCA-based architecture

Abstract

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Authors (22)

  • Photo of  Agnieszka Zagozdzinska

    Agnieszka Zagozdzinska

  • Photo of  Alan Bell

    Alan Bell

  • Photo of  Anne Dabrowski

    Anne Dabrowski

  • Photo of  Moritz Guthoff

    Moritz Guthoff

  • Photo of  Maria Hempel

    Maria Hempel

  • Photo of  Hans Henschel

    Hans Henschel

  • Photo of  Olena Karacheban

    Olena Karacheban

  • Photo of  Wolfgang Lange

    Wolfgang Lange

  • Photo of  Wolfgang Lohmann

    Wolfgang Lohmann

  • Photo of  Arkady Lokhovitskiy

    Arkady Lokhovitskiy

  • Photo of  Jessica Leonard

    Jessica Leonard

  • Photo of  Robert Loos

    Robert Loos

  • Photo of  Marco Miraglia

    Marco Miraglia

  • Photo of  Marek Penno

    Marek Penno

  • Photo of  Krzysztof Pozniak

    Krzysztof Pozniak

  • Photo of  Dominik Przyborowski

    Dominik Przyborowski

  • Photo of  David Stickland

    David Stickland

  • Photo of  Pier Trapani

    Pier Trapani

  • Photo of  Ryszard Romaniuk

    Ryszard Romaniuk

  • Photo of  Vladimir Ryjov

    Vladimir Ryjov

  • Photo of  Roberval Walsh

    Roberval Walsh

Cite as

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Details

ISSN:
0277786X
Publication year:
2014
DOI:
Digital Object Identifier (open in new tab) 10.1117/12.2076023
Verified by:
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