Search results for: METROLOGY
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Metrology and Measurement Systems
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Quantum metrology: Heisenberg limit with bound entanglement
PublicationQuantum entanglement may provide a huge boost in the precision of parameter estimation. However, quantum metrology seems to be extremely sensitive to noise in the probe state. There is an important still open question: What type of entanglement is useful as a resource in quantum metrology? Here we raise this question in relation to entanglement distillation. We provide a counterintuitive example of a family of bound entangled states...
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Optical metrology for high fidelity LCD-TV
PublicationW pracy przedstawiono aktualny stan metrologii optycznej wyświetlaczy ciekłokrystalicznych (LCD) i omówiono niedoskonałości obecnych technik pomiarowych występujące w charakteryzacji wyświetlaczy o wysokiej wierności odwzorowania. Zaprezentowano urządzenia, procedury pomiarowe i metody obróbki danych umożliwiajace obiektywną ocenę właściwości ciekłokrystalicznych odbiorników telewizyjnych.Metody te umożliwiają identyfikację artefaktów...
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Computer-assisted assessment of learning outcomes in the laboratory of metrology
PublicationIn the paper, didactic experience with broad and rapid continuous assessment of students’ knowledge, skills and competencies in the Laboratory of Metrology, which is an example of utilisation of assessment for learning, is presented. A learning management system was designed for manage, tracking, reporting of learning program and assessing learning outcomes. It has ability to provide with immediate feedback, which is used by the...
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Nanomanufacturing and Metrology
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Metrology CT technology and its applications in the precision engineering industry
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Metrology
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Chemistry-Didactics-Ecology-Metrology
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At the Limits of Criticality-Based Quantum Metrology: Apparent Super-Heisenberg Scaling Revisited
PublicationWe address the question of whether the super-Heisenberg scaling for quantum estimation is indeed realizable. We unify the results of two approaches. In the first one, the original system is compared with its copy rotated by the parameter-dependent dynamics. If the parameter is coupled to the one-body part of the Hamiltonian, the precision of its estimation is known to scale at most as N−1 (Heisenberg scaling) in terms of the number...
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A plateau-valley separation approach (PVSA) for reduction of the end-effect in surface metrology
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Journal of Chemical Metrology
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Fatigue fracture surface metrology of thin-walled tubular austenitic steel specimens after asynchronous loadings
PublicationThis paper aims to study the effect of asynchronous axial-torsional strain-controlled loading histories on fracture surface behavior of thin-walled tubular X5CrNi18-10 (304/304L) austenitic steel specimens. Tests under pure axial loading and pure torsional loading are also conducted to better segregate the effect of multiaxiality. The fractures surface topographies were examined through the profiles over the entire surface with...
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Raman scattering measurements in monitoring of polymer synthesis process. Lightmetry 2002 : Metrology and Testing Techniques Using Light.
PublicationW artykule omówiono możliwości wykorzystania pomiarów ramanowskich do monitorowania w czasie rzeczywistym przebiegu procesów syntezy materiałów polimerowych. Wykorzystano sondy światłowodowe do sprzęgnięcia aparatury pomiarowej z typowym stanowiskiem technologicznym. Pomiary miały charakter zdalny, nieniszczący i niezakłócający przebieg reakcji.
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International Journal of Metrology and Quality Engineering
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Metrology and Instruments [ Метрологія та прилади / Metrologia ta prylady ]
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DSP Applications in Metrology (EiT 2022/2023)
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DSP Applications in Metrology (EiT 2023/2024)
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Surface Topography-Metrology and Properties
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Metrology and Measurement Systems , DaPE, sem01, summer 22/23
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Metrology and Measurement Systems , DaPE, sem01, summer 23/24
e-Learning Courses