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Search results for: NUISANCE TRIPPING
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Verification of safety in low-voltage power systems without nuisance tripping of residual current devices
PublicationLow-voltage power systems require initial and periodical verification to check the effectiveness of protection against electric shock. As a protection in case of fault, automatic disconnection of supply is most often used. To verify such a protection measure, the earth fault loop impedance or resistance is measured. This measurement is easy to perform in circuits without residual current devices. When residual current devices are...
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Method of earth fault loop impedance measurement without nuisance tripping of RCDs in 3-phase low-voltage circuits
PublicationVerification of electrical safety in low-voltage power systems includes the measurement of earth fault loop impedance. This measurement is performed to verify the effectiveness of protection against indirect contact. The widespread classic methods and meters use a relatively high value of the measuring current (5–20) A, so that they are a source of nuisance tripping of residual current devices (RCDs). The meters dedicated to circuits...
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A new method of fault loop resistance measurement in low voltage systems with residual current devices
PublicationThis paper presents a new method of fault loop resistance measurement in low voltage systems with residual current devices. The method enables measuring fault loop resistance without nuisance tripping of residual current devices, by application an unconventional waveform of measurement current. It is important for proper verification of the effectiveness of protection against electric shock.
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Experimental verification of a new method of loop resistance testing in low voltage systems with residual current devices
PublicationA periodical verification of the effectiveness of protection against electric shock shall be performed in low voltage systems. The scope of this verification includes loop impedance/resistance testing. If a residual current device is installed in a tested circuit, this testing is problematic. A residual current device trips out during the test, because of the high value of measurement current. This precludes the execution of the...