Search results for: PRZEMYSŁ ELEKTRONICZNY

• AFM-assisted investigation of conformal coatings in electronics

  Publication

  • M. Szociński

  - ANTI-CORROSION METHODS AND MATERIALS - Year 2016

  Purpose – This paper aims to presents a new method of investigation of local properties of conformal coatings utilized in microelectronics. Design/methodology/approach – It is based on atomic force microscopy (AFM) technique supplemented with the ability of local electrical measurements, which apart from topography acquisition allows recording of local impedance spectra, impedance imaging and dc current mapping. Potentialities...

  Full text to download in external service