
dr inż. Wojciech Chlewicki
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Year 2023
Year 2021
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Entropy-Based Combined Metric for Automatic Objective Quality Assessment of Stitched Panoramic Images
PublicationQuality assessment of stitched images is an important element of many virtual reality and remote sensing applications where the panoramic images may be used as a background as well as for navigation purposes. The quality of stitched images may be decreased by several factors, including geometric distortions, ghosting, blurring, and color distortions. Nevertheless, the specificity of such distortions is different than those typical...
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