Depth XPS profile of vanadium pentoxide

Description

Vanadium pentoxide sample was manufactured by sol-gel method and deposited on a substrate by spin coating technique. To determine depth profile of chemical composition of thin film, etching by Argon ion gun was used. Thin film was etched three times. Chemical composition was measured by XPS method.

Dataset file

XPS.zip

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CC BY

Attribution
Raw data:: Data contained in dataset was not processed.
Software:: origin

Details

Year of publication:

2021

Verification date:

2021-06-24

Creation date:

2017

Dataset language:

English

Fields of science:

materials engineering (Engineering and Technology)

DOI:

10.34808/bvsh-gg85

Verified by:

Gdańsk University of Technology

Keywords

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Authors

Marcin Stanisław Łapiński dr hab. inż.
Institute of Nanotechnology and Materials Engineering
orcid number 0000-0002-3283-2886open in new tab
Creator

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