Dewetting of silver films detected by XPS method

Description

Dewetting of silver thin films was detected by XPS method. Thin metallic films were deposited by magnetron sputtering method. Formation of nanostructures , as a result of thermal annealing, was confirmed by SEM microscope. For comparision three samples were measured. Bulg gold, as-deposited silver film with thickness of 3 nm and nanostructures.

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Ag_XPS.zip

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Attribution
Raw data:: Data contained in dataset was not processed.
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Details

Year of publication:

2021

Verification date:

2021-06-24

Creation date:

2017

Dataset language:

English

Fields of science:

materials engineering (Engineering and Technology)

DOI:

10.34808/kfed-yf32

Verified by:

Gdańsk University of Technology

Keywords

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Authors

Marcin Stanisław Łapiński dr hab. inż.
Institute of Nanotechnology and Materials Engineering
orcid number 0000-0002-3283-2886open in new tab
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