Description
X-ray Photoelectron Spectroscopy analysis (XPS) was performed using an Omicron NanoTechnology X-ray photoelectron spectrometer with a 128-channel collector. The XPS measurements were performed under ultra-high vacuum conditions. Photoelectrons were excited by an Mg-Kα X-ray source with an X-ray anode operated at 15 keV and 300 W. The spectra were deconvoluted using the XPSPEAK software. Studied material was Sr1.05Ti0.30Fe0.70O3-d.
Dataset file
XPS_Fe2p_STF70-x_1.05.xlsx
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File details
- License:
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CC BYAttribution
Details
- Year of publication:
- 2025
- Verification date:
- 2025-05-30
- Dataset language:
- English
- Fields of science:
-
- Automation, electronic and electrical engineering (Engineering and Technology)
- materials engineering (Engineering and Technology)
- DOI:
- DOI ID 10.34808/reh7-0n02 open in new tab
- Funding:
- Series:
- Verified by:
- Gdańsk University of Technology
Keywords
- perovskite
- nonstoichiometry
- doped strontium titanate
- oxygen electrode
- xps rentgenowska spektroskopia fotoelektronowa
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