X-ray diffraction patterns of BaCe0.6Zr0.2Y0.1M0.1O3-δ (M = Fe, Pr, Tb) - Open Research Data - Bridge of Knowledge

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X-ray diffraction patterns of BaCe0.6Zr0.2Y0.1M0.1O3-δ (M = Fe, Pr, Tb)

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Description

The dataset consists of three raw X-ray diffraction (XRD) files collected using a Phillips X’Pert Pro diffractometer (CuKα radiation (𝜆 = 1.541 Å), under 40 kV and 30 mA). The diffraction patterns of BaCe0.6Zr0.2Y0.1Fe0.1O3-δ (BCZYFe), BaCe0.6Zr0.2Y0.1Pr0.1O3-δ (BCZYPr), and BaCe0.6Zr0.2Y0.1Tb0.1O3-δ (BCZYTb) were collected at room temperature. Collected XRD data enabled the evaluation of the phase composition of samples and the crystal structure of synthesized materials. The XRD patterns were later analyzed using HighScore Plus XRD Analysis Software. NiO was used for the densification in the second step of the synthesis for all three samples, which is visible in the case of the diffraction patterns of BCZYPr and BCZYTb (the synthesis route for measured samples is presented in a separate word document). 

The samples were synthesized using the solid-state reaction method. Stoichiometric amounts of BaCO3, CeO2, ZrO2, Y2O3, Fe2O3, Pr6O11, and Tb4O7 were ball-milled and calcined at 950 ℃ for 24 h. The resulting powder was then milled again, uniaxially pressed (250 MPa), and sintered at 1300 ℃ for 10 h. NiO was used for the densification in the second step of the synthesis for all three samples, which is visible in the case of the diffraction patterns of BCZYPr and BCZYTb.

Dataset file

X_ray_diffraction_BCZYTb,BCZYPr,BCZYFe - ASC.zip
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download file X_ray_diffraction_BCZYTb,BCZYPr,BCZYFe - ASC.zip

File details

License:
Creative Commons: by 4.0 open in new tab
CC BY
Attribution
File embargo:
2023-06-01
Raw data:
Data contained in dataset was not processed.

Details

Year of publication:
2023
Verification date:
2023-03-13
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/nwxz-kb33 open in new tab
Funding:
Series:
Verified by:
Gdańsk University of Technology

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Version this document has several versions

DOI 10.34808/5av3-pt88 represents the latest version of the data.

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