Description
Data contain results from X-ray diffraction (XRD) measurements of pristine Bi2O3 and Gd2O3 structures using Aeris diffractometer (Malvern Panalytical, Malvern, UK) with Cu-Kα radiation (λ = 1.544 Å)
Data consists:
BiGd-typeA - Bi2O3-Gd2O3 structures coated with silica (synthesis method A)
BiGd-typeB - Bi2O3-Gd2O3 structures coated with silica (synthesis method B)
To open the raw data HighScore software (external license) is required.
Dataset file
XRD data.zip
115.9 kB,
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downloads: 62
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File details
- License:
-
open in new tabCC BYAttribution
- Raw data:
- Data contained in dataset was not processed.
- Software:
- HighScore
Details
- Year of publication:
- 2024
- Verification date:
- 2024-02-12
- Dataset language:
- English
- Fields of science:
-
- civil engineering, geodesy and transport (Engineering and Technology)
- chemical engineering (Engineering and Technology)
- materials engineering (Engineering and Technology)
- DOI:
- DOI ID 10.34808/zqda-as51 open in new tab
- Funding:
- Verified by:
- West Pomeranian University of Technology in Szczecin
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