XRD investigations of the lithium titanate thin films - Open Research Data - Bridge of Knowledge

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XRD investigations of the lithium titanate thin films

Description

Nanocrystalline thin films with 800 nm thickness were prepared by sol–gel method. To examine the influence of the annealing temperature on as-prepared films crystallization, the coatings were heated at temperature from 500 °C up to 600 °C  for 20h. Structure of manufactured thin films was investigated using X-ray diffraction (XRD). The most visible lithium titanate phase was obtained after 20 h annealing at 550 °C.

Dataset file

LTO.zip
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File details

License:
Creative Commons: by 4.0 open in new tab
CC BY
Attribution
Raw data:
Data contained in dataset was not processed.
Software:
origin

Details

Year of publication:
2021
Verification date:
2021-06-23
Creation date:
2011
Dataset language:
English
Fields of science:
  • materials engineering (Engineering and Technology)
DOI:
DOI ID 10.34808/fhca-gb57 open in new tab
Verified by:
Gdańsk University of Technology

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