Comparative study of donor-induced quantum dots in Si nano-channels by single-electron transport characterization and Kelvin probe force microscopy - Publication - Bridge of Knowledge

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Comparative study of donor-induced quantum dots in Si nano-channels by single-electron transport characterization and Kelvin probe force microscopy

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Authors (6)

  • Photo of  K. Tyszka

    K. Tyszka

  • Photo of  D. Moraru

    D. Moraru

  • Photo of  A. Samanta

    A. Samanta

  • Photo of  T. Mizuno

    T. Mizuno

  • Photo of  R. Jabłoński

    R. Jabłoński

  • Photo of  M. Tabe

    M. Tabe

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Details

Category:
Magazine publication
Type:
Magazine publication
Published in:
JOURNAL OF APPLIED PHYSICS no. 117, edition 24,
ISSN: 0021-8979
ISSN:
0021-8979
Publication year:
2015
DOI:
Digital Object Identifier (open in new tab) 10.1063/1.4923229
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