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Enhancement of defects induced optical nonlinearity in Al: ZnO thin films by electron beam

Abstract

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Authors (9)

  • Photo of  Albin Antony

    Albin Antony

  • Photo of  Poornesh P

    Poornesh P

  • Photo of  J. Jedryka

    J. Jedryka

  • Photo of  K. Ozga

    K. Ozga

  • Photo of  Gopalkrishna Hegde

    Gopalkrishna Hegde

  • Photo of  Suresh Kulkarni

    Suresh Kulkarni

  • Photo of  Vikash Chandra

    Vikash Chandra

  • Photo of  Vijay Verma

    Vijay Verma

  • Photo of  Jishnu Dwivedi

    Jishnu Dwivedi

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Details

Category:
Magazine publication
Type:
Magazine publication
Published in:
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING no. 128,
ISSN: 1369-8001
ISSN:
13698001
Publication year:
2021
DOI:
Digital Object Identifier (open in new tab) 10.1016/j.mssp.2021.105747
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