Search
Abstract
In the paper authors present two methods, which allows to identify the RTS noise in noise signal of semiconductor devices. The first one was elaborated to identify the RTS noise and also to estimate the number of its levels. The second one can be used to estimate all of the parameters of Gaussian and non-Gaussian components in the noise signal in a frequency domain.
Citations
-
0
CrossRef
-
0
Web of Science
-
0
Scopus
Authors (2)
Cite as
Full text
full text is not available in portal
Keywords
Details
- Category:
- Conference activity
- Type:
- publikacja w wydawnictwie zbiorowym recenzowanym (także w materiałach konferencyjnych)
- Title of issue:
- Noise and Fluctuations Twentieth International Conference on Noise and Fluctuations (ICNF-2009) Pisa, Italy, 14-19 June 2009 strony 357 - 360
- Language:
- English
- Publication year:
- 2009
- Bibliographic description:
- Konczakowska A., Stawarz-Graczyk B.: The Methods for RTS Noise Identification// Noise and Fluctuations Twentieth International Conference on Noise and Fluctuations (ICNF-2009) Pisa, Italy, 14-19 June 2009/ ed. eds. Massimo Macucci, Giovanni Basso. Berlin: Springer, 2009, s.357-360
- DOI:
- Digital Object Identifier (open in new tab) 10.1063/1.3140473
- Verified by:
- Gdańsk University of Technology
seen 94 times