Thermal measurement of dissipated power for Gallium Nitride Gate Injection Transistors - Publication - Bridge of Knowledge

Thermal measurement of dissipated power for Gallium Nitride Gate Injection Transistors

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Authors (3)

L. Wydzgowski
T. Tarczewski
L. Grzesiak

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Publication year:: 2019
DOI:: Digital Object Identifier (open in new tab) 10.23919/epe.2019.8915375
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