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Zespół Metrologii i Optoelektroniki
Research Potential* komputerowo wspomagana metrologia i diagnostyka * projektowanie systemów * mikrosystemów i makrosystemów elektronicznych * testowanie i diagnostyka elektroniczna * pomiary właściwości szumowych i zakłóceń * spektroskopia impedancyjna * telemetria i telediagnostyka internetowa * katedra redaguje Metrology and Measurement Systems * kwartalnik PAN znajdujący się na liście JCR
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Laboratorium Syntezy Innowacyjnych Materiałów i Elementów
Business OfferZespół specjalistycznych urządzeń pozwala dokonywać syntezy diamentu mikro- i nanokrystalicznego oraz diamentu domieszkowanego borem i azotem do zastosowań w optoelektronice oraz nanosensoryce. Domieszkowany borem nanodiament (BDD) jest obecnie najwydajniejszym materiałem półprzewodnikowym do zastosowania w wytwarzaniu biosensorów elektrochemicznych. Laboratorium może otrzymywać ciągłe cienkie polikrystaliczne, domieszkowane elektrody...
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Robert Bogdanowicz dr hab. inż.
PeopleRobert Bogdanowicz received his Ph.D. degree with honours in Electronics from the Gdansk University of Technology. He worked as a post-doc researcher in Ernst-Moritz-Arndt-Universität Greifswald Institut für Physik. He has initiated optical emission imaging of muti-magnetron pulsed plasma and contributed to the development of antibacterial implant coatings deposited by high-power impulse magnetron sputtering. He moved back to...
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Reactive deposition of TiNx layers in a DC-magnetron discharge
PublicationTiNx layers have been deposited in 'balanced mode' and 'unbalanced mode' of a reactive DC-magnetron plasma (carrier gas argon, reactive gas nitrogen) under different conditions. Discharge power and reactive gas flow have been varied. The layers have been examined by X-ray photoelectron spectroscopy (XPS), X-ray reflectometry (XR), and spectroscopic ellipsometry (SE). The results of the layer analyses were combined with plasma investigations...
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Optical and chemical characterization of thin TiNx films deposited by DC-magnetron sputtering
PublicationThin titanium nitride (tinx) films were deposited on silicon substrates by means of a reactive dc-magnetron plasma. Layers were synthesized under various conditions of discharge power and nitrogen flows in two operation modes of the magnetron (the so-called "balanced" and "unbalanced" modes). The optical constants of the tinx films were investigated by spectroscopic ellipsometry (se). X-ray photoelectron spectroscopy (xps) was...
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Surface Plasmon-Coupled Emission of Rhodamine 110 Aggregates in a Silica Nanolayer
PublicationFirst analysis of strong directional surface plasmon-coupled emission(SPCE) of ground-state formed intermolecular aggregates of Rhodamine 110 (R110) insilica nanofilms deposited on silver nanolayers is reported. Until now, the processes ofenergy transport and its trapping due to aggregate formation have not been studied in the presence of SPCE. A new approach to multicomponent systems with weakly and strongly fluorescent centers...
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Ellipsometric study of carbon nitride films deposited by DC-magnetron sputtering
PublicationWe report the optical properties of a carbon nitride (CNx) film as a function of nitrogen concentration (N/C) of the deposited film. As nitrogen concentration is increased (N/C ratio) in a CNx film, the refractive index and band gap also increase. The real and imaginary parts, n and k (refractive index and extinction coefficient) of the complex refraction index of carbon nitride films were determined by spectroscopic ellipsometry...