Stanisław Galla was born in 1970 in Gdańsk. He graduated from the Secondary Technical School of Mechanical and Electrical Engineering in Gdansk (1990). He studied at the Faculty of Electrical Engineering at Gdansk University of Technology (graduated in 1996). His PhD thesis entitled "Methodology for increasing the accuracy of low frequency measurements of periodic disturbance indicators in low voltage networks" was defended in 2009 at the Faculty of Electrical Engineering and Automation at Gdansk University of Technology. In 1995 he started working at the Electrotechnical Institute in Gdansk as an assistant in the Laboratory of Electromagnetic Compatibility. From 1996 to 2000 he was also temporarily employed at the Gdansk University of Technology at the Faculty of Electrical Engineering and Automation at the instructor's position. In 1997 he completed Postgraduate Study of Real Estate Valuation at the University of Agriculture and Technology in Olsztyn, specialist courses in the field of electromagnetic compatibility and the course for internal auditor. Since March 2001, he was employed at the Faculty of Electronics, Telecommunications and Informatics at Gdańsk University of Technology as an assistant lecturer in the Department of Measurement Apparatus and since 2009 he has been an assistant professor in the Department of Metrology and Optoelectronics. At the same time, in the years 2001 – 2015, he worked part - time in the research and development laboratory at Satel Sp. o.o. as EMC measurement and standardization specialist. He is an author or co-author of more than 60 publications and a member of the Polish Society of Theoretical and Applied Electrotechnics. He is also a technical manager in the LAB – 6, the laboratory of electromagnetic compatibility, at the Faculty of Electrical and Control Engineering.

Field of interest:

Electromagnetic compatibility testing, non-destructive testing with the use of thermovision, placing devices on the market (requirements and tests), thermographic measurements of electronic devices, electromagnetic immunity tests.