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Open Research Data - Scanning Probe Microscopies data

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  • Statistics of AFM current-voltage curves

    Open Research Data
    open access - series: Scanning Probe Microscopies data

    Mapping surface electrical conductivity offers enormous cognitive possibilities regarding the structure and properties of modern materials. The technique invented for this purpose (Conductive AFM) by Murrel's team and colleagues allows independent monitoring of the local conductivity of materials in correlation with the topographic profile. The mentioned...

  • Silicon microcantilever with impedance sensor

    Open Research Data
    open access - series: Scanning Probe Microscopies data

    The issue of microelectromechanical systems (MEMS) [1] has been enjoying popularity and interest since the 90s of the 20th century. Microcells are one of the simplest devices of this type, but they can be widely used in sensors. There are reports on the possibility of using this type of sensors in the context of such important issues as diagnostics...

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