Search
Deep-Learning-Based Precise Characterization of Microwave Transistors Using Fully-Automated Regression Surrogates
Abstract
Accurate models of scattering and noise parameters of transistors are instrumental in facilitating design procedures of microwave devices such as low-noise amplifiers. Yet, data-driven modeling of transistors is a challenging endeavor due to complex relationships between transistor characteristics and its designable parameters, biasing conditions, and frequency. Artificial neural network (ANN)-based methods, including deep learning (DL), have been found suitable for this task by capitalizing on their flexibility and generality. Yet, rendering reliable transistor surrogates is hindered by a number of issues such as the need for finding good match between the input data and the network architecture and hyperparameters (number and sizes of layers, activation functions, data pre-processing methods), possible overtraining, etc. This work proposes a novel methodology, referred to as Fully Adaptive Regression Model (FARM), where all network components and processing functions are automatically determined through Tree Parzen Estimator. Our technique is comprehensively validated using three examples of microwave transistors and demonstrated to offer a competitive edge over the state-of-the-art methods in terms of modeling accuracy and handling the aforementioned issues pertinent to standard ANN-based surrogates.
Citations
-
3 7
CrossRef
-
0
Web of Science
-
4 0
Scopus
Authors (6)
-
Nurullah Calik
-
Filiz Gunes
-
Mehmet Belen
-
Peyman Mahouti
Cite as
Full text
- Publication version
- Accepted or Published Version
- DOI:
- Digital Object Identifier (open in new tab) 10.1038/s41598-023-28639-4
- License
-
open in new tab
Keywords
Details
- Category:
- Articles
- Type:
- artykuły w czasopismach
- Published in:
-
Scientific Reports
no. 13,
ISSN: 2045-2322 - Language:
- English
- Publication year:
- 2023
- Bibliographic description:
- Calik N., Gunes F., Kozieł S., Pietrenko-Dąbrowska A., Belen M., Mahouti P.: Deep-Learning-Based Precise Characterization of Microwave Transistors Using Fully-Automated Regression Surrogates// Scientific Reports -Vol. 13, (2023), s.1-16
- DOI:
- Digital Object Identifier (open in new tab) 10.1038/s41598-023-28639-4
- Sources of funding:
-
- Free publication
- Verified by:
- Gdańsk University of Technology
seen 96 times
Recommended for you
Reliable computationally-efficient behavioral modeling of microwave passives using deep learning surrogates in confined domains
- S. Kozieł,
- N. Calik,
- P. Mahouti
- + 1 authors
Variable Data Structures and Customized Deep Learning Surrogates for Computationally Efficient and Reliable Characterization of Buried Objects
- R. Yurt,
- H. Torpi,
- A. Kizilay
- + 2 authors
Buried Object Characterization Using Ground Penetrating Radar Assisted by Data-Driven Surrogate-Models
- R. Yurt,
- H. Torpi,
- P. Mahouti
- + 2 authors