In the present theoretical work, it is assumed that a piezoelectric nanoplate is connected to the voltage meter which voltages have resulted from deformation of the plate due to in-plane compressive forces whether they are critical buckling loads or arbitrary forces. In order to derive governing equations, a simplified four-variable shear deformation plate theory has been employed using Hamilton’s principle and Von-Kármán assumptions. Modified couple stress theory has been applied to considering size-dependent effects in nano size. In order to compare the results, a validation has been done with the results of macroscopic. Results have been presented by changing some parameters, such as aspect ratio, various boundary conditions and length scale parameter influence on the produced voltage by the piezoelectric nanoplate. The most important outcomes show that an increase in length scale parameter leads to decreasing the produced voltage at constant in-plane arbitrary forces.