Low frequency noise and trap density in GaN/AlGaN field effect transistors - Publication - Bridge of Knowledge

Low frequency noise and trap density in GaN/AlGaN field effect transistors

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G. Cywinski

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Category:: Magazine publication
Type:: Magazine publication
Published in:: APPLIED PHYSICS LETTERS no. 115, edition 18,
ISSN: 0003-6951
ISSN:: 0003-6951
Publication year:: 2019
DOI:: Digital Object Identifier (open in new tab) 10.1063/1.5119227
Verified by:: No verification

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