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Abstract
W artykule przedstawiono wyniki pomiaró szumów cz. wstecznie spolaryzowanych diod Schottky'ego.
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Keywords
Details
- Category:
- Conference activity
- Type:
- publikacja w wydawnictwie zbiorowym recenzowanym (także w materiałach konferencyjnych)
- Title of issue:
- Noise and Fluctuations Twentieth International Conference on Noise and Fluctuations (ICNF-2009) Pisa, Italy, 14-19 June 2009 strony 645 - 648
- Language:
- English
- Publication year:
- 2009
- Bibliographic description:
- Szewczyk A., Stawarz-Graczyk B.: Low Frequency Noise Measurement of Reverse Polarized Silicon Carbide Schottky Diodes// Noise and Fluctuations Twentieth International Conference on Noise and Fluctuations (ICNF-2009) Pisa, Italy, 14-19 June 2009/ ed. eds. Massimo Macucci, Giovanni Basso. Berlin: Springer, 2009, s.645-648
- DOI:
- Digital Object Identifier (open in new tab) 10.1063/1.3140557
- Verified by:
- Gdańsk University of Technology
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