Phase diagram of P3HT:PC70BM thin films based on variable-temperature spectroscopic ellipsometry - Publication - Bridge of Knowledge

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Phase diagram of P3HT:PC70BM thin films based on variable-temperature spectroscopic ellipsometry

Abstract

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Authors (6)

  • Photo of B. Hajduk

    B. Hajduk

  • Photo of H. Bednarski

    H. Bednarski

  • Photo of B. Jarząbek

    B. Jarząbek

  • Photo of P. Nitschke

    P. Nitschke

  • Photo of H. Janeczek

    H. Janeczek

  • Photo of Barbara Hajduk

    Barbara Hajduk

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Details

Category:
Magazine publication
Type:
Magazine publication
Published in:
POLYMER TESTING no. 84,
ISSN: 0142-9418
ISSN:
01429418
Publication year:
2020
DOI:
Digital Object Identifier (open in new tab) 10.1016/j.polymertesting.2020.106383
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