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Abstract
This brief presents an analog-to-digital converter (ADC) suitable for acquisition and processing of images in the global-shutter mode at the pixel level. The ADC consists of an analog comparator, a multi-directional shift register for the comparator states, and a 16-bit reversible binary counter with programmable step size. It works in the traditional single-slope mode. The novelty is that during each step of the reference ramp, neighboring pixels can exchange status information. During the conversion, the direction and step size of the counter are set globally to realize the corresponding coefficient of a convolution kernel. This technique does not slow down the conversion when used for small kernels (3×3) and does not significantly increase sensor noise. Convolution windows of arbitrary size can be implemented. The concept was verified in an experimental 64×64 imaging array implemented in 180 nm CMOS technology.
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Authors (6)
-
Yichuang Sun
- School of Engineering and Computer Science, University of Hertfordshire, Hatfield, U.K
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- Category:
- Articles
- Type:
- artykuły w czasopismach
- Published in:
-
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS
no. 70,
pages 3258 - 3262,
ISSN: 1549-7747 - Language:
- English
- Publication year:
- 2023
- Bibliographic description:
- Kłosowski M., Sun Y., Jendernalik W., Blakiewicz G., Jakusz J., Szczepański S.: Single-Slope ADC With Embedded Convolution Filter for Global-Shutter CMOS Image Sensors// IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS -Vol. 70,iss. 9 (2023), s.3258-3262
- DOI:
- Digital Object Identifier (open in new tab) 10.1109/tcsii.2023.3266714
- Sources of funding:
-
- Statutory activity/subsidy
- Project CMOS sensor with smart grid of pixels of layered structure for fast acquisition and simultaneous extraction of information from image
- Verified by:
- Gdańsk University of Technology
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