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Abstract
The authors present a fiber-optic Fabry-Pérot interferometer built with the application of diamond and zinc oxide (ZnO) thin layers. Thin ZnO films were deposited on the tip of a standard telecommunication single-mode optical fiber (SMF- 28) while the diamond layer was grown on the plate of silicon substrate. Investigated ZnO layers were fabricated by atomic layer deposition (ALD) and the diamond films were deposited using Microwave Plasma Enhanced Chemical Vapor Deposition (μPE CVD) system. Different thickness of layers was examined. The measurements were performed for the fiber-optic Fabry-Pérot interferometer working in the reflective mode. Spectra were registered for various thicknesses of ZnO layer and various length of the air cavity. As a light source, two superluminescent diodes (SLD) with central wavelength of 1300 nm and 1550 nm were used in measurement set-up
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Details
- Category:
- Conference activity
- Type:
- materiały konferencyjne indeksowane w Web of Science
- Title of issue:
- Conference Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2016 strony 121 - 126
- ISSN:
- 0277-786X
- Language:
- English
- Publication year:
- 2016
- Bibliographic description:
- Majchrowicz D., Den W., Hirsch M..: The low coherence Fabry-Pérot interferometer with diamond and ZnO layers, W: Conference Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2016, 2016, SPIE-INT SOC OPTICAL ENGINEERING,.
- DOI:
- Digital Object Identifier (open in new tab) 10.1117/12.2249162
- Verified by:
- Gdańsk University of Technology
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