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Search results for: MATHEMATICAL MODEL, FINITE ELEMENT ANALYSIS, REDUCED ORDER SYSTEMS, RELIABILITY, FREQUENCY ESTIMATION, COMPUTATIONAL MODELING, NUMERICAL MODELS
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Zespół Metrologii i Optoelektroniki
Research Teams* komputerowo wspomagana metrologia i diagnostyka * projektowanie systemów * mikrosystemów i makrosystemów elektronicznych * testowanie i diagnostyka elektroniczna * pomiary właściwości szumowych i zakłóceń * spektroskopia impedancyjna * telemetria i telediagnostyka internetowa * katedra redaguje Metrology and Measurement Systems * kwartalnik PAN znajdujący się na liście JCR