Search results for: Polyazomethine PPI - Bridge of Knowledge

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Search results for: Polyazomethine PPI

Search results for: Polyazomethine PPI

  • Physical properties of polyazomethine thin films doped with iodine

    Purpose: The aim of this paper is to show influence of doping 1,4-phenylene-methylenenitrilo-1,4-phenylenenitrilomethylene (PPI) with iodine and to propose doping mechanism and its impact on electronicstructure of doped PPI thin films.Design/methodology/approach: Influence of iodine doping on electronic structure of polyazomethine thinfilms was investigated. Optical absorption spectra, XRD spectra and AFM images of doped PPI...

  • Influence of LCVD technologicalparameters on propertiesof polyazomethine thin films

    Publication

    - Year 2009

    Purpose: The aim of this paper is to show influence of technological parameters (temperature and gas streamintensity) of low-temperature chemical vapour deposition (LCVD) on optical properties and morphology ofpolyazomethine thin films.Design/methodology/approach: Thin layers of poly (1,4-phenylene-methylenenitrilo-1,4-phenylenenitrilo-methylene) (PPI) were prepared by low temperature LCVD method with use of argon as a transport...

  • Optical properties of polyazomethine with oxygen atom in the backbon

    Publication

    - Year 2008

    Purpose: The aim of this paper is to show results of optical measurement performed on poly –(1-(4-methylenephenoxy-1)phenylene-4-methylene-1.4-phenylnenitrylomethylene) (PPI2) polyazomethine thinfilms and to compare with poly - (1.4-phenylenemethylenenitrilo-1.4 phenylenenitrilomethylene) (PPI).Design/methodology/approach: Influence of oxygen atom in the polymer chain on optical properties ofpolyazomethine was investigated....

  • Reconstruction of thin films polyazomethine based on microscopic images

    Publication

    - Year 2011

    Purpose: The aim of this paper was to investigate changes in surface morphology of thin films ofpolyazomethine PPI. Thin films were prepared using low-temperature chemical vapor deposition (CVD)method.Design/methodology/approach: The changes in surface topography was observed by the atomicforce microscope AFM and scanning electron microscope SEM. The results of roughness have beenprepared in the software WSxM NanoTec Spanish...