Abstract

Purpose: The aim of this paper was to investigate changes in surface morphology of thin films ofpolyazomethine PPI. Thin films were prepared using low-temperature chemical vapor deposition (CVD)method.Design/methodology/approach: The changes in surface topography was observed by the atomicforce microscope AFM and scanning electron microscope SEM. The results of roughness have beenprepared in the software WSxM NanoTec Spanish company.Findings: Results and their analysis allow to conclude that the transporting gas, which is an importantfactor in technology has a significant influence on surface morphology of thin films poliazomethine PPI.Known polyazomethine electrical properties and the possibility of obtaining a uniform thin layer showthat it can be good material for optoelectronic and photovoltaic application.Practical implications: Known polyazomethine electrical properties and the possibility of obtaininga uniform thin layer show that it can be good material for optoelectronic and photovoltaic application.Originality/value: The paper presents some researches of polyazomethine thin films deposited bylow-temperature chemical vapor deposition on glass BK7
(PDF) Reconstruction of thin films polyazomethine based on microscopic images. Available from: https://www.researchgate.net/publication/266032684_Reconstruction_of_thin_films_polyazomethine_based_on_microscopic_images [accessed Oct 29 2024].

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