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Abstract
Research on synthesis, characterization and determination of processing – structure – property relationships of commercially important ferroelectric thin films has been performed. The sol-gel-type solution deposition technique was applied to produce good quality thin films of Ba0.6Sr0.4TiO3 (BST60/40) chemical composition on the stainless steel substrates. The thin films were characterized in terms of their microstructure, crystal structure, phase composition, piezoelectric and dielectric properties. It was found that the BST60/40 thin film adopted the cubic structure at room temperature with an elementary cell parameter a=3.971(8) Å. Morphology of the thin film surface was studied with Atomic Force Microscopy (AFM). Average roughness of the thin films surface was found (Sa=0.055 mkm). Piezoresponse Force Microscopy (PFM) was applied for the thin film characterisation. Active piezoelectric regions were found in BST60/40 thin film. Therefore dielectric response measured at room temperature was studied in assumption of piezoelectric electric equivalent circuit.
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- Publication version
- Accepted or Published Version
- DOI:
- Digital Object Identifier (open in new tab) 10.1142/S2010135X19500255
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- Category:
- Articles
- Type:
- artykuły w czasopismach
- Published in:
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Journal of Advanced Dielectrics
no. 9,
pages 1 - 7,
ISSN: 2010-135X - Language:
- English
- Publication year:
- 2019
- Bibliographic description:
- Czekaj D., Lisińska-Czekaj A.: Piezoresponse force microscopy and dielectric spectroscopy study of Ba0.6Sr0.4TiO3 thin films// Journal of Advanced Dielectrics -Vol. 9,iss. 3 (2019), s.1-7
- DOI:
- Digital Object Identifier (open in new tab) 10.1142/s2010135x19500255
- Verified by:
- Gdańsk University of Technology
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