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Katalog Danych Badawczych - Scanning Probe Microscopies data
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Katalog Danych Badawczych
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Colvolutional calibration of AFM probe
Dane BadawczeAtomic force microscopy is based on the interaction of the examined surface with a probe of a pyramidal shape, tipped with a sharp end with a radius of curvature ranging from single nanometers to hundreds of nanometers. The resolution of the obtained image is of course dependent on the above-mentioned geometric size, and the resulting image is a convolutional...