Stability of thin film diamond mirror for applications in interferometers under the short-time exposure on selected aggressive chemicals

Daria Majchrowicz; Marzena Hirsch

doi:10.1117/12.2282789

Stability of thin film diamond mirror for applications in interferometers under the short-time exposure on selected aggressive chemicals

Abstrakt

In presented study a thin boron-doped diamond film was proposed for application in the interferometry as a highly durable optical mirror. The unique properties of the diamond films, like high chemical stability and hardness, allow them to be used even in the chemically aggressive environment, where the commonly used silver mirrors can be susceptible to damage. The investigated nanodiamond layer was fabricated by uPE CVD method on a glass plate and the boron concentration in the gas phase was 7500 ppm. The mirror made from this layer was exposed to several corrosive acids and then the optical properties and surface quality of the film was examined by optical microscopy. To further evaluate the performance of the proposed mirror, it was placed in a fiber optic Fabry-Pѐrot interferometer and the quality of the detected spectra was also analyzed. Performed measurements allow us to conclude that the thin film diamond mirror is well suited for the application in the optical interferometer and it ensures high resistance to the harsh environmental conditions.

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Kategoria:: Aktywność konferencyjna
Typ:: materiały konferencyjne indeksowane w Web of Science
Tytuł wydania:: Twelfth Integrated Optics – Sensors, Sensing Structures and Methods Conference strony 1 - 6
ISSN:: 0277-786X
Język:: angielski
Rok wydania:: 2017
Opis bibliograficzny:: Majchrowicz D., Hirsch M..: Stability of thin film diamond mirror for applications in interferometers under the short-time exposure on selected aggressive chemicals, W: Twelfth Integrated Optics – Sensors, Sensing Structures and Methods Conference, 2017, ,.
DOI:: Cyfrowy identyfikator dokumentu elektronicznego (otwiera się w nowej karcie) 10.1117/12.2282789
Weryfikacja:: Politechnika Gdańska